During flight testing of unmanned aerial vehicles (UAVs) for remote sensing, one of the key stages is qualimetry of optoelectronic surveillance systems based on linear ground resolution. It is to be checked at different flight altitudes, which is often difficult to achieve due to restrictions on using airspace by UAVs and adverse weather conditions. The author focuses on development of a methodology for determining the linear resolution of optoelectronic systems using predictive research methods. This study resulted with a methodology for determining linear ground resolution based on extrapolation of the trend of its dependence on flight altitude using a third order polynomial function. This methodology enabled predicting the said resolution without performing flights at a given altitude. The author presents the results of evaluating the linear ground resolution of the optoelectronic target equipment of a quadcopter-type UAV, obtained in accordance with the proposed methodology. The predicted linear resolution estimates obtained through the developed methodology were confirmed to be 96,2 % precise. This technique makes an effective tool for qualimetry of optoelectronic systems during flight tests. Eliminating the need for flights at a predetermined altitude allows for optimization of the flight test program, thereby reducing the testing time taken by unmanned aerial vehicles for remote sensing