The second article in a series of three consecutive articles devoted to the phenomenon of the displacement of the same points in overlapping scans obtained adjacent CCD matrices with optoelectronic imagery. This article uncovered the main causes of displacement and the theoretical estimation of their values due to the influence of each of these reasons. Noted that the obtained theoretical estimates of displacements are consistent with the results of measurements of real optical-electronic space images. A classification of the considered reasons for gross, systematic and random offsets. It is shown that the coarse offset is caused mainly by clouds and digital correlation error in the measurement images. Systematic offset depends on the inclination of the imaging system; size, location, and installation errors CCDs in the focal plane; the deviation of the actual speed of movement of the image of the theoretical value and the thermal expansion of optical-electronic Converter. The random offsets are determined by a number of factors, the main of which are terrain remove terrain, temperature changes and instability of the angular movement of the imaging system. It is concluded that the displacements of the same points in the ceiling adjacent CCDs are a characteristic feature of the optic-electronic space images and affect their measuring accuracy.