The article opens a cycle of three consecutive publications dedicated to the phenomenon of the displacement of the same points in overlapping scans obtained adjacent CCD matrices with opto-electronic imagery. This phenomenon was noticed by other authors, but the proposed explanation for the origin of displacements and the resulting estimates are insufficient, and developed their solutions seem controversial from the point of view of recovery of the measuring accuracy of opticalelectronic space images, determined by the physical laws of their formation. In the first article the mathematical modeling of the expected displacements based on the design features of a scanning opto-electronic imaging equipment. It is shown that actual bias cannot be forecast, because they include additional terms, which may be gross, systematic and random values. The proposed algorithm for computing the most probable values of the additional displacement and ways to address some of the systematic components of these displacements in a mathematical model of optical-electronic remote sensing.